Current issue


Vol.43 (2013), No. 1

Click on the title to see the abstract and more info

Ohmic contacts for room-temperature AlGaAs/GaAs quantum cascade lasers (QCL)
Anna Baranska, Anna Szerling, Piotr Karbownik, Krzysztof Hejduk, Maciej Bugajski, Adam Laszcz, Krystyna Golaszewska-Malec, Wojciech Filipowski
pp. 5-15 No PDF file No PDF file in base  
Properties of thin films of high-k oxides grown by atomic layer deposition at low temperature for electronic applications
Sylwia Gieraltowska, Lukasz Wachnicki, Bartlomiej S. Witkowski, Marek Godlewski, Elzbieta Guziewicz
pp. 17-25 No PDF file No PDF file in base  
Influence of high Al fraction on reactive ion etching of AlGaN/GaN heterostructures
Jacek Gryglewicz, Andrzej Stafiniak, Mateusz Wosko, Joanna Prazmowska, Bogdan Paszkiewicz
pp. 27-33 No PDF file No PDF file in base  
Measurements of AlGaN/GaN heterostructures for sensor applications
Mikolaj Ryszard Hojko, Dorota Paszuk, Bogdan Paszkiewicz
pp. 35-38 No PDF file No PDF file in base  
Influence of a charge region on the operation of InGaAs/InAlAs/InP avalanche photodiodes
Jaroslaw Jurenczyk, Dariusz Zak, Janusz Kaniewski
pp. 39-46 No PDF file No PDF file in base  
Two-dimensional modeling of surface photovoltage in metal/insulator/n-GaN structure with cylindrical symmetry
Maciej Matys, Paulina Powroznik, Dawid Kupka, Boguslawa Adamowicz
pp. 47-52 No PDF file No PDF file in base  
Oscillator strength of optical transitions in InGaAsN/GaAsN/GaAs quantum wells
Arkadiusz Mika, Grzegorz Sek, Krzysztof Ryczko, Michal Kozub, Anna Musial, Aleksander Marynski, Jan Misiewicz, Fabian Langer, Sven Höfling, Teresa Appel, Martin Kamp, Alfred Forchel
pp. 53-60 No PDF file No PDF file in base  
Influence of AlN spacer on the properties of AlGaN/AlN/GaN heterostructures
Mateusz Wosko, Bogdan Paszkiewicz, Regina Paszkiewicz, Marek Tlaczala
pp. 61-66 No PDF file No PDF file in base  
Chemical analysis of Ti/Al/Ni/Au ohmic contacts to AlGaN/GaN heterostructures
Wojciech Macherzynski, Kornelia Indykiewicz, Bogdan Paszkiewicz
pp. 67-72 No PDF file No PDF file in base  
Gallium oxide buffer layers for gallium nitride epitaxy
Ryszard Korbutowicz, Jan Wnek, Pawel Panachida, Jaroslaw Serafinczuk, Rudolf Srnanek
pp. 73-79 No PDF file No PDF file in base  
Annealing time effects on the surface morphology
of C–Pd films prepared on silicon covered with SiO2
Miroslaw Kozlowski, Joanna Radomska, Halina Wronka, Elzbieta Czerwosz, Piotr Firek, Kamil Sobczak, Piotr Dluzewski
pp. 81-89 No PDF file No PDF file in base  
Formation of Cr ohmic contact on graphitized 6H-SiC(0001) surface
Milosz Grodzicki, Piotr Mazur, Radoslaw Wasielewski, Antoni Ciszewski
pp. 91-98 No PDF file No PDF file in base  
TiO2 thin films grown on SiO2–Si(111) by the reactive evaporation method
Milosz Grodzicki, Radoslaw Wasielewski, Piotr Mazur, Stefan Zuber, Antoni Ciszewski
pp. 99-107 No PDF file No PDF file in base  
Influence of RF ICP PECVD process parameters of diamond-like carbon films on DC bias and optical emission spectra
Waldemar Oleszkiewicz, Janusz Markowski, Rudolf Srnanek, Wojciech Kijaszek, Jacek Gryglewicz, Jaroslav Kovac, Marek Tlaczala
pp. 109-115 No PDF file No PDF file in base  
Magnetic properties and surface domain structure of (Nd0.85Dy0.15)10Fe83Zr1B6 thin ribbons
Agnieszka Ceglarek, Danuta Plusa, Marcin Dospial, Marcin Nabialek, Pawel Wieczorek
pp. 117-122 No PDF file No PDF file in base  
Morphological, topographical and FTIR characterizations of Pd–C films
Joanna Rymarczyk, Anna Kaminska, Justyna Keczkowska, Miroslaw Kozlowski, Elzbieta Czerwosz
pp. 123-132 No PDF file No PDF file in base  
Temperature-induced changes in the topography and morphology of C–nPd films deposited on fused silica
Ryszard Diduszko, Ewa Kowalska, Miroslaw Kozlowski, Elzbieta Czerwosz, Anna Kaminska
pp. 133-141 No PDF file No PDF file in base  
Properties of hydroxyapatite layers used for implant coatings
Agata Dudek, Lidia Adamczyk
pp. 143-151 No PDF file No PDF file in base  
Photocatalytic properties of Ti–V oxides thin films
Jaroslaw Domaradzki, Michal Mazur, Karolina Sieradzka, Damian Wojcieszak, Bogdan Adamiak
pp. 153-162 No PDF file No PDF file in base  
Optical methods applied in thickness and topography testing of passive layers on implantable titanium alloys
Janusz Szewczenko, Janusz Jaglarz, Marcin Basiaga, Jan Kurzyk, Zbigniew Paszenda
pp. 173-180 No PDF file No PDF file in base  
Raman spectroscopy of CdTe/ZnTe quantum dot structures
Eunika Zielony, Ewa Placzek-Popko, Paulina Kamyczek, Artur Henrykowski, Grzegorz Karczewski
pp. 181-185 No PDF file No PDF file in base  
Temperature-dependence of cathodoluminescence of zinc oxide monolayers obtained by atomic layer deposition
Bartlomiej Slawomir Witkowski, Lukasz Wachnicki, Piotr Nowakowski, Andrzej Suchocki, Marek Godlewski
pp. 187-194 No PDF file No PDF file in base  
The MFM studies of the surface domain structure of Sm–Fe–Co–Zr–Cu thin ribbons
Marcin Dospial, Marcin Nabialek, Michal Szota, Lukasz Michta, Pawel Wieczorek, Katarzyna Bloch, Pawel Pietrusiewicz, Katarzyna Ozga, Jacek Michalczyk
pp. 195-200 No PDF file No PDF file in base  
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